Diagnostic Instruments D10 NEF F-Mount Camera Adapter PLAN APO Forensics and evidence examination lighting

Forensics and evidence examination lighting

Silicon wafer backside and through-silicon inspection at 50× requiring maximum working clearance

delivering good resolution and contrast for cell biology

this objective provides a wide field of view for rapid specimen survey and navigation — the ideal starting point in a multi-magnification NIR inspection workflow before stepping up to higher magnification M Plan Apo NIR objectives

LEICA MZ12

Diagnostic Instruments D10 NEF F-Mount Camera Adapter PLAN APO Forensics and evidence examination lightingDIAGNOSTIC INSTRUMENTS D10NEF 1. 0 X F MOUNT WITH FOCUS ADJUSTMENT FOR NIKON ECLIPSE MICROSCOPES F MOUNT CATALOG NUMBER: D10 NEF CONDITION: EXCELLENT UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS