Olympus MPlanFL N 20X Epi Objective | 0.40 NA, BD, Infinity Corrected MICROSCOPES 173 this objective integrates seamlessly into

this objective integrates seamlessly into metallurgical

CATALOG NUMBER: 11506247

identifying minerals

5× auxiliary objective attaches to the front of the SZ series stereo microscope body to increase the effective magnification range

Semiconductor wafer probing and testing

Olympus MPlanFL N 20X Epi Objective | 0.40 NA, BD, Infinity Corrected MICROSCOPES 173 this objective integrates seamlessly intoPremium 20 objective with brightfield and darkfield capability ideal for industrial inspection and materials science applications. 20 Magnification, NA 0. 45 High resolution for detailed imaging and defect detection. Brightfield Darkfield (BD) Capability Dual mode imaging for enhanced contrast and defect detection on reflective surfaces. Working Distance (3 mm) Adequate clearance for standard industrial specimens. MPLFLN Plan Semi Apochromat Design