Olympus UAPO 340 20X Objective PLAN APO High Clarity

High Clarity

or any setup where accessories must be positioned near the sample surface

and analysis

optically correct image to the camera sensor — enabling detailed documentation of specimens directly through the stereo microscope

Precision Berek compensator for quantitative retardation measurement in polarized light microscopy — ideal for materials science

Olympus UAPO 340 20X Objective PLAN APO High ClarityOLYMPUS UAPO 340 20X OBJECTIVE RMS THREAD NUMERICAL APERTURE: 0. 75 WORKING DISTANCE: 0. 66 MM CONDITION: EXCELLENT CONDITION WITH FLAWLESS OPTICS COMPATIBLE WITH: OLYMPUS INFINITY CORRECTED MICROSCOPES UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS